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This project focuses on development of
modeling; analysis and control of dimensional variation in
complex multistage assembly processes (MAP) with compliant
parts such as in automotive, aerospace, appliance and
electronics industries. The goal is to develop a generic MAP
model with capabilities to represent key product and process
control characteristics/features (KPCs/KCCs) with varying
resolution/"information granularity" that can be utilized
during design, launch and full production phases of a new
manufacturing system. The model will be based on a generic
Computer-Aided Design and Manufacturing (CAD/CAM) system
integrated with statistical analysis to predict manufacturing
process performance in early design phase. A challenge facing
the proposed plan is the diversity of required information and
lack of physical and geometrical relations between KCC and KPC.
The research will focus on developing: (1) variation
propagation models integrating statistical and CAD/CAM
information; (2) multi-resolution/granularity of KPC/KCC as
they change during product development; (3) computational
efficiency for simulation of multistage assembly processes;
and (4) generic issues pertaining to new process-oriented
modeling, design and control. Details in
poster1,
poster2. |
