Laboratory for 

      Manufacturing $ystem Realization and Synthesis

MA/RS HOME->MA/RS ROADMAP->SOVA->DIAGNOSTICS

Objective:

To quickly diagnose faults and correct the root cause in the complex multi-stations manufacturing process (MMP), SOVA process diagnosis aims to provide solutions joining multivariate statistical methods with engineering knowledge. Traditional way of inspection based on SPC is insufficient to explain the root cause while the complex interaction usually beyond the capability of multivariate statistical methods. SOVA diagnosis use three major phases – identification, localization and isolation to extract fault pattern and map to the pattern library for recognition. Our current researches are parallel in rigid assembly diagnosis and compliant part assembly. For rigid assembly, we are developing fault localization and variation analysis method for multiple faults in MMP. Also analysis and optimization methods are explored for sensor distribution. For compliant assembly, we are developing statistical modal analysis for compliant structure in isolation phase. The following picture shows the overall framework and road map for SOVA diagnosis.

• Ceglarek, D., Shi, J., 1996 "Fixture Failure Diagnosis for the Autobody Assembly Using Pattern Recognition" Trans. of ASME, Journal of Engineering for Industry, Vol. 118, No. 1, pp. 55-66

• Khan, A., Ceglarek, D., Shi, J., Ni, J., Woo, T. C., 1999 "Sensor Location Optimization for Fault Diagnosis in Multi-Fixture Assembly Systems" Trans. of ASME, Journal of Manufacturing Science and Engineering, Vol. 121, No. 1, pp. 109-117.

• Ceglarek, D., Shi, J., Wu, S.M., 1994 "A Knowledge-based Diagnosis Approach for the Launch of the Auto-body Assembly Process", Trans. of ASME, Journal of Engineering for Industry, Vol. 116, No. 4, pp. 491-499.

• Khan, A., Ceglarek, D., Ni, J., 1998 "Sensor Location Optimization for Fault Diagnosis in Multi-Fixture Assembly Systems," Trans. of ASME, Journal of Manufacturing Science and Engineering, Vol. 120, No. 4, pp. 781-792, also in 1996 ASME International Mechanical Engineering Congress and Exposition, MED-4, pp. 473-484, Atlanta, GA..

• Khan, A., Ceglarek, D., Shi, J., Ni, J., Woo, T. C., 1999 "Sensor Optimization for Fault Diagnosis in Single Fixture System: A Methodology," Trans. of ASME, Journal of Manufacturing Science and Engineering, Vol. 121, No. 1, pp. 109-117.

• Ceglarek, D., Shi, J., 1999 "Fixture Failure Diagnosis for Sheet Metal Assembly with Consideration of Measurement Noise," Trans. of ASME, Journal of Manufacturing Science and Engineering, Vol. 121, No. 4, pp. 771-777, also in Proceedings of the Second S.M. Wu Symposium on Manufacturing Science, pp. 168-177, Ann Arbor, MI, May 24.

• Khan, A., Ceglarek, 2000 "Sensor Optimization for Fault Diagnosis in Multi-Fixture Assembly Systems with Distributed Sensing," Trans. of ASME, Journal of Manufacturing Science and Engineering, Vol. 122, No. 1, pp. 215-226, also in 1998 ASME International Mechanical Engineering Congress and Exposition, Anaheim, CA, MED-Vol. 8, pp. 315-324.

• Rong, Q., Ceglarek, D., Shi, J., 2000 "Dimensional Fault Diagnosis for Compliant Beam Structure Assemblies," Trans. of ASME, Journal of Manufacturing Science and Engineering, Vol. 122, No. 4, pp. 773-780, also in 1998 ASME International Mechanical Engineering Congress and Exposition, Anaheim, CA, MED-Vol. 8, pp. 93-102.

•  Ding, Y., Shi, J., Ceglarek, D., 2002, "Diagnosability Analysis of Multistage Manufacturing Processes," ASME Transactions, Journal of Dynamic Systems, Measurement, and Control, Vol. 124, No. 1, pp. 1-13.

• Ding, Y., Ceglarek, D., Shi, J., 2002, "Fault Diagnosis of Multistage Manufacturing Processes by using State Space Approach," ASME Trans., Journal of Manufacturing Science and Engineering, Vol. 124, No. 2, pp. 313-322

• Ding, Y., Kim, P., Ceglarek, D., Jin, J., 2003, "Optimal Sensor Distribution for Variation Diagnosis in Multi-station Assembly Processes," IEEE Transactions on Robotics and Automation, Vol. 19(4), pp. 543-556.

• Mannar, K., Ceglarek, D., 2004, "Continuous Failure Diagnosis for Assembly Systems using Rough Set Approach," Annals of CIRP, Vol.53/1, pp. 39-42.